I feel that the new JESD9B document presents a good structure for external visual inspection of electronic microcircuits covering a wide range of commercial off-the-shelf products manufactured in the plastics arena. This arena is much more significant to manufacturers today than in 1994, which was the peak time for the Mil-Std-883 Method 2009 which covered only hermetically sealed components.
This updated specification is long overdue and a useful method, combining old and new industry criteria for proper external visual inspection protocols.
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