Discussions on Proper Electrical Testing of Components at the DMSMS 2011 Conference

A major concern at the recently concluded DMSMS conference was the US Department of Defense potential cutback of electrical testing of electronic components.

The Military and Aerospace industry attendees and exhibitors had major concerns about the limited testing performed by a curve/contact tester versus the preferred DC, AC, functional and parametric testing of a device.  The preferred tests are important in uncovering counterfeit products.

I gave a lecture at the conference entitled “Proper Electrical Testing to Detect Counterfeit Components.”  Its scope was to educate members of the electronics industry about the risks associated with performing only basic contact testing with simple counterfeit detectors as opposed to the preferred functional and parametric exercises required to properly test these suspect electronic components.  Electrical testing provides a more thorough exercise in testing electronic component products to illustrate their accuracy and authenticity.

As exhibitors at the recent DMSMS conference, NJMET presented our Mission: Imposter Counterfeit Component Test Program. The team at NJMET participated in the Counterfeit Parts Control Plan Implementations, the DMSMS Tools and Services Program, as well as technical sessions and panels which included: Institutionalizing Standard Practices, Defense Initiatives and Their Impact to DMSMS, Counterfeit Mitigation Strategies, and Counterfeit Reporting.

For more about the DMSMS conference see “Joseph Federico talks on proper electrical testing at the DMSMS and Standardization Conference 2011.”